TDDB reliability prediction based on the statistical analysis of hard break-down including multiple soft breakdown and wear out

Sahhaf, SaharSaharSahhafDegraeve, RobinRobinDegraeveRoussel, PhilippePhilippeRousselKauerauf, ThomasThomasKaueraufKaczer, BenBenKaczerGroeseneken, GuidoGuidoGroeseneken2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12833TDDB reliability prediction based on the statistical analysis of hard break-down including multiple soft breakdown and wear outProceedings paper