Impact of temperature and breakdown statistics on reliability predictions for ultra-thin oxides

Groeseneken, GuidoGuidoGroesenekenDegraeve, RobinRobinDegraeveKaczer, BenBenKaczer2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3475Impact of temperature and breakdown statistics on reliability predictions for ultra-thin oxidesOral presentation