Radiation damage of MOSFETs by high-temperature electron irradiation

Ohyama, H.H.OhyamaHayama, K.K.HayamaTakakura, K.K.TakakuraSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6656Radiation damage of MOSFETs by high-temperature electron irradiationProceedings paper