Xu, BlairBlairXuHantschel, ThomasThomasHantschelTsigkourakos, MenelaosMenelaosTsigkourakosVandervorst, WilfriedWilfriedVandervorst2021-10-232021-10-2320151862-6300https://imec-publications.be/handle/20.500.12860/26205Scanning spreading resistance microscopy for the electrical characterization of diamond interfacial layersJournal articlehttp://onlinelibrary.wiley.com/doi/10.1002/pssa.201532234/abstract