Impact of silicidation on the excess noise behaviour of MOS transistors

Vandamme, EwoutEwoutVandammeVandamme, L.K.J.L.K.J.VandammeClaeys, CorCorClaeysSimoen, EddyEddySimoenSchreutelkamp, RobRobSchreutelkamp2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/956Impact of silicidation on the excess noise behaviour of MOS transistorsJournal article