Salehi, MajidMajidSalehiDegani, LucaLucaDeganiRoveri, MarcoMarcoRoveriHughes, DannyDannyHughesCrispo, BrunoBrunoCrispo2023-07-062023-04-182023-07-0620231545-5971WOS:000952937700017https://imec-publications.be/handle/20.500.12860/41466Discovery and Identification of Memory Corruption Vulnerabilities on Bare-Metal Embedded DevicesJournal article10.1109/TDSC.2022.3149371WOS:000952937700017