Soens, CharlotteCharlotteSoensVan der Plas, GeertGeertVan der PlasWambacq, PietPietWambacqDonnay, StephaneStephaneDonnayKuijk, MaartenMaartenKuijk2021-10-162021-10-162005-07https://imec-publications.be/handle/20.500.12860/11253Performance degradation of LC-tank VCOs by impact of digital switching noise in lightly doped substratesJournal article