Pogany, D.D.PoganyFürböck, C.C.FürböckSeliger, N.N.SeligerHabas, PredragPredragHabasGornik, E.E.GornikKubicek, StefanStefanKubicekDecoutere, StefaanStefaanDecoutere2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/2092Optical testing of submicron-technology MOSFETs and bipolar transistorsProceedings paper