Meneghini, M.M.MeneghiniMeneghesso, G.G.MeneghessoZanoni, E.E.ZanoniFabris, ElenaElenaFabrisBorga, MatteoMatteoBorgaPosthuma, NielsNielsPosthumaZhao, MingMingZhaoDe Jaeger, BriceBriceDe JaegerYou, ShuzhenShuzhenYouDecoutere, StefaanStefaanDecoutere2022-03-112022-03-1120211541-7026WOS:000672563100009https://imec-publications.be/handle/20.500.12860/39418Vertical stack reliability of GaN-on-Si buffers for low-voltage applicationsProceedings paper10.1109/IRPS46558.2021.9405097978-1-7281-6893-7WOS:000672563100009LEAKAGE CURRENTSILICON