Kaczer, BenBenKaczerFranco, JacopoJacopoFrancoWeckx, PieterPieterWeckxRoussel, PhilippePhilippeRousselSimicic, MarkoMarkoSimicicPutcha, VamsiVamsiPutchaBury, ErikErikBuryCho, Moon JuMoon JuChoDegraeve, RobinRobinDegraeveLinten, DimitriDimitriLintenGroeseneken, GuidoGuidoGroesenekenDebacker, PeterPeterDebackerParvais, BertrandBertrandParvaisRaghavan, PraveenPraveenRaghavanCatthoor, FranckyFranckyCatthoorRzepa, GerhardGerhardRzepaWaltl, MichaelMichaelWaltlGoes, WolfgangWolfgangGoesGrasser, TiborTiborGrasser2021-10-232021-10-2320160038-1101https://imec-publications.be/handle/20.500.12860/26797The defect-centric perspective of device and circuit reliability – From gate oxide defects to circuitsJournal articlehttp://www.sciencedirect.com/science/article/pii/S0038110116300909