A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards

Marinissen, Erik JanErik JanMarinissenFodor, FerencFerencFodorDe Wachter, BartBartDe WachterKiesewetter, JoergJoergKiesewetterHill, EricEricHillSmith, KenKenSmith2021-10-242021-10-242017-09https://imec-publications.be/handle/20.500.12860/28920A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cardsProceedings paperhttp://ieeexplore.ieee.org/document/8097130