Chen, Wen ChiehWen ChiehChenChen, Shih-HungShih-HungChenHellings, GeertGeertHellingsChiarella, ThomasThomasChiarellaChen, JieJieChenSubramanian, SujithSujithSubramanianSiew, Yong KongYong KongSiewLinten, DimitriDimitriLintenGroeseneken, GuidoGuidoGroeseneken2021-10-282021-10-282020https://imec-publications.be/handle/20.500.12860/34888Understanding ESD characteristics of GGNMOS in bulk FinFET technologyProceedings paperhttps://ieeexplore.ieee.org/document/9241355