Test strategies for wide-I/O memory, 3D-TSV technology test vehicles and ultra-fine-pitch applications

Smith, KenKenSmithBock, DanielDanielBockGleeson, ReadReadGleesonJolley, MikeMikeJolleyMarinissen, Erik JanErik JanMarinissen2021-10-202021-10-202012-11https://imec-publications.be/handle/20.500.12860/21525Test strategies for wide-I/O memory, 3D-TSV technology test vehicles and ultra-fine-pitch applicationsProceedings paper