Claeys, CorCorClaeysPut, SofieSofiePutRafi, J.M.J.M.RafiPavanello, J.M.J.M.PavanelloMartino, J.A.J.A.MartinoSimoen, EddyEddySimoen2021-10-172021-10-172009https://imec-publications.be/handle/20.500.12860/15112Reliability performance characterization of SOI FinFETsProceedings paper