Wu, LizhouLizhouWuTaouil, MottaqiallahMottaqiallahTaouilRao, SiddharthSiddharthRaoMarinissen, Erik JanErik JanMarinissenHamdioui, SaidSaidHamdioui2021-10-262021-10-262018-11https://imec-publications.be/handle/20.500.12860/32286Electrical modeling of STT-MRAM defectsProceedings paperhttps://ieeexplore.ieee.org/document/8624749