Determination of layer morphology of rough layers in organic light emitting diodes by X-ray reflectivity

Sachs, IanIanSachsFuhrmann, MarcMarcFuhrmannDeferme, WimWimDefermeMoebius, HildegardHildegardMoebius2023-04-282022-12-172023-04-2820232577-8196WOS:000888358600001https://imec-publications.be/handle/20.500.12860/40880Determination of layer morphology of rough layers in organic light emitting diodes by X-ray reflectivityJournal article10.1002/eng2.12594WOS:000888358600001SURFACE-ROUGHNESS