A fast and accurate method to study the impact of interface traps on germanium MOS performance

Hellings, GeertGeertHellingsEneman, GeertGeertEnemanMitard, JeromeJeromeMitardMartens, KoenKoenMartensWang, Wei-EWei-EWangHoffmann, Thomas Y.Thomas Y.HoffmannMeuris, MarcMarcMeurisDe Meyer, KristinKristinDe Meyer2021-10-192021-10-1920110018-9383https://imec-publications.be/handle/20.500.12860/19056A fast and accurate method to study the impact of interface traps on germanium MOS performanceJournal article