Verhulst, AnneAnneVerhulstLeonelli, DanieleDanieleLeonelliRooyackers, RitaRitaRooyackersGroeseneken, GuidoGuidoGroeseneken2021-10-192021-10-1920110021-8979https://imec-publications.be/handle/20.500.12860/20061Drain voltage dependent analytical model of tunnel field-effect transistorsJournal articlehttp://link.aip.org/link/?JAP/110/024510