Zhang, J.F.J.F.ZhangZhao, C.Z.C.Z.ZhaoChen, A.H.A.H.ChenGroeseneken, GuidoGuidoGroesenekenDegraeve, RobinRobinDegraeve2021-10-152021-10-152004-08https://imec-publications.be/handle/20.500.12860/9970Hole traps in silicon dioxides - Part I: PropertiesJournal article