Trap density in conducting organic semiconductors determined from temperature dependence of J-V characteristics

Kumar, VikramVikramKumarJain, SureshSureshJainKapoor, A.K.A.K.KapoorPoortmans, JefJefPoortmansMertens, RobertRobertMertens2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7761Trap density in conducting organic semiconductors determined from temperature dependence of J-V characteristicsJournal article