Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems

Haelvoet, KurtKurtHaelvoetCriel, StevenStevenCrielDobbelaere, FrankyFrankyDobbelaereMartens, LucLucMartensDe Langhe, PascalPascalDe LangheDe Smedt, R.R.De Smedt2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1245Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systemsProceedings paper