Compact Modeling of Nonideal Trapping/Detrapping Processes in GaN Power Devices

Modolo, N.N.ModoloDe Santi, C.C.De SantiBaratella, GiulioGiulioBaratellaBettini, A.A.BettiniBorga, MatteoMatteoBorgaPosthuma, NielsNielsPosthumaBakeroot, BenoitBenoitBakerootYou, ShuzhenShuzhenYouDecoutere, StefaanStefaanDecoutereBevilaqua, A.A.BevilaquaNeviani, A.A.NevianiMeneghesso, G.G.MeneghessoZanoni, E.E.ZanoniMeneghini, M.M.Meneghini2022-11-092022-07-212022-11-0920220018-9383WOS:000824722300001https://imec-publications.be/handle/20.500.12860/40148Compact Modeling of Nonideal Trapping/Detrapping Processes in GaN Power DevicesJournal article10.1109/TED.2022.3184622WOS:000824722300001HEMTS