Understanding the basic advantages of bulk FinFETs for sub- and near-threshold logic from device measurements

Crupi, FeliceFeliceCrupiAlioto, MassimoMassimoAliotoFranco, JacopoJacopoFrancoMagnone, PaoloPaoloMagnoneTogo, MitsuhiroMitsuhiroTogoHoriguchi, NaotoNaotoHoriguchiGroeseneken, GuidoGuidoGroeseneken2021-10-202021-10-2020121549-7747https://imec-publications.be/handle/20.500.12860/20515Understanding the basic advantages of bulk FinFETs for sub- and near-threshold logic from device measurementsJournal article