Raman on-chip: Current status and future tracks

Le Thomas, NicolasNicolasLe ThomasLiu, ZuyangZuyangLiuLin, ChupaoChupaoLinZhao, HaolanHaolanZhaoBaets, RoelRoelBaets2022-03-162022-03-1620210277-786XWOS:000672733000002https://imec-publications.be/handle/20.500.12860/39475Raman on-chip: Current status and future tracksProceedings paper10.1117/12.2579222978-1-5106-4214-0WOS:000672733000002PHASE NOISEEVANESCENT EXCITATIONTHERMODYNAMICSSPECTROSCOPYFLUCTUATIONSCOLLECTIONSCATTERINGLIMIT