Edge illumination X-ray phase contrast imaging with continuous mask motion

Huyge, BenBenHuygeFrancken, NicholasNicholasFranckenSanctorum, JoaquimJoaquimSanctorumSanctorum, JonathanJonathanSanctorumDe Beenhouwer, JanJanDe BeenhouwerSijbers, JanJanSijbers2025-11-032025-11-032025-09-221094-4087https://imec-publications.be/handle/20.500.12860/58355engEdge illumination X-ray phase contrast imaging with continuous mask motionJournal article10.1364/OE.568153WOS:001580559900007SIMULATIONROTATIONGATE