Mahadeva Iyer, NatarajanNatarajanMahadeva IyerLinten, DimitriDimitriLintenThijs, StevenStevenThijsJansen, PhilippePhilippeJansenTremouilles, DavidDavidTremouillesDecoutere, StefaanStefaanDecoutereGroeseneken, GuidoGuidoGroeseneken2021-10-162021-10-162005-06https://imec-publications.be/handle/20.500.12860/10833RFCMOS ESD protection and reliabilityProceedings paper