Maes, HermanHermanMaesGroeseneken, GuidoGuidoGroesenekenDegraeve, RobinRobinDegraeveDe Blauwe, JanJanDe BlauweVan den Bosch, GeertGeertVan den Bosch2021-10-012021-10-011998https://imec-publications.be/handle/20.500.12860/2747Assessment of oxide reliability and hot carrier degradation in CMOS technologyJournal article