Gao, ZhanZhanGaoHu, Min-ChunMin-ChunHuMarinissen, Erik JanErik JanMarinissenMalagi, SantoshSantoshMalagiSwenton, JoeJoeSwentonHuisken, JosJosHuiskenGoossens, KeesKeesGoossens2021-10-272021-10-272019-05https://imec-publications.be/handle/20.500.12860/33008Application of cell-aware test on an advanced 3nm CMOS standard-cell libraryProceedings paper