Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam

Hoenicke, PhilippPhilippHoenickeWaehlisch, AndreAndreWaehlischUnterumsberger, RainerRainerUnterumsbergerBeckhoff, BurkhardBurkhardBeckhoffBogdanowicz, JanuszJanuszBogdanowiczCharley, Anne-LaureAnne-LaureCharleyMertens, HansHansMertensRochat, NevineNevineRochatHartmann, Jean-MichelJean-MichelHartmannGiambacorti, NarcisoNarcisoGiambacorti2024-05-032024-05-032024-JUL 80957-4484WOS:001207473600001https://imec-publications.be/handle/20.500.12860/43903Reference-free x-ray fluorescence analysis with a micrometer-sized incident beamJournal article10.1088/1361-6528/ad3affWOS:001207473600001MONOCHROMATOR BEAMLINEXRFSAMPLESPTBQUANTIFICATIONSPECTROMETRYRADIATIONMEDLINE:38579688