Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown

O'Sullivan, BarryBarryO'SullivanVan Beek, SimonSimonVan BeekRoussel, PhilippePhilippeRousselRao, SiddharthSiddharthRaoKim, WoojinWoojinKimCouet, SebastienSebastienCouetSwerts, JohanJohanSwertsYasin, FarrukhFarrukhYasinCrotti, DavideDavideCrottiLinten, DimitriDimitriLintenKar, Gouri SankarGouri SankarKar2021-10-262021-10-262018https://imec-publications.be/handle/20.500.12860/31462Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdownProceedings paperhttps://ieeexplore.ieee.org/document/8353678