Alvarez, DavidDavidAlvarezFouchier, MarcMarcFouchierKretz, J.J.KretzHartwich, J.J.HartwichSchoemann, S.S.SchoemannVandervorst, WilfriedWilfriedVandervorst2021-10-152021-10-152004-06https://imec-publications.be/handle/20.500.12860/8476Fabrication and characterization of full diamond tips for scanning-spreading resistance microscopyJournal article