Lambrecht, NielsNielsLambrechtDe Zutter, DanielDanielDe ZutterVande Ginste, DriesDriesVande GinstePues, HugoHugoPues2021-10-242021-10-242017-09https://imec-publications.be/handle/20.500.12860/28749Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC testProceedings paperhttp://ieeexplore.ieee.org/document/8094745