Nguyen Hoang, ThoanThoanNguyen HoangJivanescu, MihaelaMihaelaJivanescuO'Sullivan, BarryBarryO'SullivanPantisano, LuigiLuigiPantisanoGordon, IvanIvanGordonAfanas'ev, ValeryValeryAfanas'evStesmans, AndreAndreStesmans2021-10-202021-10-2020120003-6951https://imec-publications.be/handle/20.500.12860/21198Correlation between interface traps and paramagnetic defects in c-Si/a-Si:H heterojunctionsJournal article