A design experiment for measurement of the spectral content of substrate noise in mixed-signal integrated circuits

Van Heijningen, MarcMarcVan HeijningenCompiet, JohnJohnCompietWambacq, P.P.WambacqDonnay, StephaneStephaneDonnayBolsens, IvoIvoBolsens2021-10-142021-10-141999https://imec-publications.be/handle/20.500.12860/3927A design experiment for measurement of the spectral content of substrate noise in mixed-signal integrated circuitsProceedings paper