Ratchev, PetarPetarRatchevVan De Peer, MyriamMyriamVan De PeerHo, MengMengHoVerlinden, B.B.VerlindenBender, HugoHugoBenderDe Wolf, IngridIngridDe Wolf2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/8060Effect of recrystallization and grain growth on the reliability of Cu-Cu wire bondsProceedings paper