Analysis and improved compact modelling of the breakdown behaviour of sub-0.25 micron ESD protection ggNMOS devices

Vassilev, VesselinVesselinVassilevLorenzini, MartinoMartinoLorenziniGroeseneken, GuidoGuidoGroesenekenSteyaert, MichelMichelSteyaertMaes, HermanHermanMaes2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5803Analysis and improved compact modelling of the breakdown behaviour of sub-0.25 micron ESD protection ggNMOS devicesProceedings paper