Naka, N.N.NakaOhyama, H.H.OhyamaTsunoda, I.I.TsunodaTakakura, K.K.TakakuraBargallo Gonzalez, MireiaMireiaBargallo GonzalezSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-182021-10-182010https://imec-publications.be/handle/20.500.12860/17682Strain evaluation of electron irradiated SiGe/Si diodes by Raman spectroscopyProceedings paper