Impact of proton irradiation on strained triple gate SOI p- and n-MOSFETs

Agopian, P.G.D.P.G.D.AgopianMartino, J.A.J.A.MartinoKoboyashi, D.D.KoboyashiSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/18458Impact of proton irradiation on strained triple gate SOI p- and n-MOSFETsProceedings paper