Understanding the impact of programming pulses and electrode materials on the endurance properties of scaled Ta2O5 RRAM cells

Chen, MichaelMichaelChenGoux, LudovicLudovicGouxFantini, AndreaAndreaFantiniRedolfi, AugustoAugustoRedolfiClima, SergiuSergiuClimaDegraeve, RobinRobinDegraeveChen, YangyinYangyinChenJurczak, GosiaGosiaJurczak2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23630Understanding the impact of programming pulses and electrode materials on the endurance properties of scaled Ta2O5 RRAM cellsProceedings paper