Feijoo, Pedro C.Pedro C.FeijooCho, Moon JuMoon JuChoTogo, MitsuhiroMitsuhiroTogoSan Andrés, EnriqueEnriqueSan AndrésGroeseneken, GuidoGuidoGroeseneken2021-10-192021-10-1920110026-2714https://imec-publications.be/handle/20.500.12860/18903Positive bias temperature instabilities on sub-nanometer EOT FinFETsJournal article