Bruynseraede, ChristopheChristopheBruynseraedeTokei, ZsoltZsoltTokeiIacopi, FrancescaFrancescaIacopiBeyer, GeraldGeraldBeyerMichelon, JulienJulienMichelonMaex, KarenKarenMaex2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/10166The impact of scaling on interconnect reliabilityProceedings paper