A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability

Kaczer, BenBenKaczerFranco, JacopoJacopoFrancoWeckx, PieterPieterWeckxRoussel, PhilippePhilippeRousselPutcha, VamsiVamsiPutchaBury, ErikErikBurySimicic, MarkoMarkoSimicicVaisman Chasin, AdrianAdrianVaisman ChasinLinten, DimitriDimitriLintenParvais, BertrandBertrandParvaisCatthoor, FranckyFranckyCatthoorRzepa, GerhardGerhardRzepaWaltl, MichaelMichaelWaltlGrasser, TiborTiborGrasser2021-10-252021-10-2520180026-2714https://imec-publications.be/handle/20.500.12860/30988A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variabilityJournal articlehttps://www.sciencedirect.com/science/article/pii/S0026271417305516