Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements

De Geest, KobeKobeDe GeestLievens, EnesEnesLievensPicavet, EwoutEwoutPicavetDe Buysser, KlaartjeKlaartjeDe BuysserVan Thourhout, DriesDriesVan ThourhoutBeeckman, JeroenJeroenBeeckman2025-02-022025-02-022025-JAN 32515-7647WOS:001404239900001https://imec-publications.be/handle/20.500.12860/45140Extraction of individual Pockels coefficients of thin films via interferometric reflection measurementsJournal article10.1088/2515-7647/ada902WOS:001404239900001MACH-ZEHNDER MODULATORSELECTROOPTICAL PROPERTIESSILICONPZT