Low-frequency noise assessment in n- and p-channel sub-10nm triple-gate FinFETs

Boudier, DimitriDimitriBoudierCretu, BogdanBogdanCretuSimoen, EddyEddySimoenVeloso, AnabelaAnabelaVelosoCollaert, NadineNadineCollaertThean, AaronAaronThean2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/26372Low-frequency noise assessment in n- and p-channel sub-10nm triple-gate FinFETsProceedings paper