Fang, WenWenFangSimoen, EddyEddySimoenArimura, HiroakiHiroakiArimuraMitard, JeromeJeromeMitardSioncke, SonjaSonjaSionckeMertens, HansHansMertensMocuta, AndaAndaMocutaCollaert, NadineNadineCollaertLuo, JunJunLuoZhao, ChaoChaoZhaoThean, AaronAaronTheanClaeys, CorCorClaeys2021-10-222021-10-2220150018-9383https://imec-publications.be/handle/20.500.12860/25264Low frequency noise characterization of GeOx passivated Germanium MOSFETsJournal articlehttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7116554