Gaubas, E.E.GaubasVanhellemont, J.J.VanhellemontSimoen, EddyEddySimoenTheuwis, A.A.TheuwisClauws, P.P.Clauws2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12184On the impact of metal impurities on the carrier lifetime in n-type germaniumProceedings paper