Simoen, EddyEddySimoenCretu, BogdanBogdanCretuFang, WenWenFangAoulaiche, MarcMarcAoulaicheRoutoure, Jean-MarcJean-MarcRoutoureCarin, RegisRegisCarinDos Santos, SaraSaraDos SantosLuo, JunJunLuoZhao, ChaoChaoZhaoMartino, JoaoJoaoMartinoClaeys, CorCorClaeys2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/24526Towards single-trap spectroscopy: Generation-recombination noise in UTBOX SOI nMOSFETsMeeting abstract