Direct measurement of cesium retention for sputtering with low energy Cs+ and oxygen background flooding

Berghmans, BartBartBerghmansVandervorst, WilfriedWilfriedVandervorst2021-10-172021-10-172009https://imec-publications.be/handle/20.500.12860/14978Direct measurement of cesium retention for sputtering with low energy Cs+ and oxygen background floodingMeeting abstract