Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics

Zenari, MicheleMicheleZenariBuffolo, MatteoMatteoBuffoloDe Santi, CarloCarloDe SantiGoyvaerts, JeroenJeroenGoyvaertsGrabowski, AlexanderAlexanderGrabowskiGustavsson, JohanJohanGustavssonBaets, RoelRoelBaetsLarsson, AndersAndersLarssonRoelkens, GuntherGuntherRoelkensMeneghesso, GaudenzioGaudenzioMeneghessoZanoni, EnricoEnricoZanoniMeneghini, MatteoMatteoMeneghini2024-08-222024-01-242024-08-2220240018-9383WOS:001137398600001https://imec-publications.be/handle/20.500.12860/43450Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon PhotonicsJournal article10.1109/TED.2023.3346370WOS:001137398600001