Celano, UmbertoUmbertoCelanoHantschel, ThomasThomasHantschelGiammaria, GuidoGuidoGiammariaChintala, Ravi ChandraRavi ChandraChintalaConard, ThierryThierryConardBender, HugoHugoBenderVandervorst, WilfriedWilfriedVandervorst2021-10-222021-10-2220150021-8979https://imec-publications.be/handle/20.500.12860/25043Evaluation of the electrical contact area in contact-mode scanning probe microscopyJournal articlehttp://scitation.aip.org/content/aip/journal/jap/117/21/10.1063/1.4921878